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OSE5203 - Fundamentals of Applied Optics
This course is designed to provide a comprehensive foundation in Applied Optics for the beginning student in optical engineering
as well as to perhaps serve as a terminal course in applied optics (along with the Applied Optics Laboratory) for the student
specializing in Optical Science or Photonics. Practical optical engineering concepts and practices will be emphasized. Topics
covered in the lectures will include: Foundations of Geometrical Optics, Geometrical Theory of Image Formation, Basic Optical
Devices and Instruments, Radiometry and Flux Transfer in Imaging Systems, Diffraction Effects in Imaging Systems, Introduction
to Aberration Theory, Image Evaluation/Analysis, Optical Manufacturing and Testing, Demonstration of Computer-automated
Optical Design.
Prerequisites
- Undergraduate degree in Science or Engineering or equivalent experience
- (Consent of Instructor)
- Graduate standing
Suggested reading
- Geometrical Optics and Optical Design, Mouroulis and Macdonald, Oxford University Press
- Modern Optical Engineering, Warren J. Smith, McGraw Hill
- Handbook of Lens Design, Malacara and Malacara, Marcel Dekker, Inc.
- Optical Engineering Fundamentals, Bruce H. Walker, McGraw-Hill
- Elements of Modern Optical Design, Donald C. O'Shea, Wiley Series of Pure and Applied Optics
- Optics, Eugene Hecht, Addison-Wesley Publishing Co.
Course Outline
- Introduction
- Course Description, Course Outline, Text and Reference Material, Expectations, Grading Policy.
- The Electromagnetic Spectrum, Hierarchy of Optical Theories, Optical Engineering Philosophy.
- Historical Development of Optics
- Foundations of Geometrical Optics
- Concepts of Geometrical Optics, Rays and Wavefronts (Malus’ Theorem)
- Fermat's Principle, Rectilinear Propagation, Vectorial Law of Reflection/ Refraction, Snell's Law.
- Critical Angle and Total Internal Reflection, Dispersion, Optical Materials, Refractive Index Measurements
- Plane Mirrors and Prisms, the Plane Parallel Plate, Thin Prisms, The Achromatic Wedge.
- Variable Power (Risley) Prisms, The Direct Vision Prism and the Achromatic Prism.
- Geometrical Theory of Image Formation
- Gaussian Image Formation, Cardinal Points, Graphical Ray Tracing,
- Generalized Imaging Eqs. of Newton and Descartes (Newton’s Lens Eq. and Gauss’ Lens Eq.)
- Transverse and Longitudinal magnification, Angular magnification and the Helmholtz Invariant.
- Paraxial Ray Tracing, Stops and Pupils (Vignetting), Marginal and Chief Rays (the Lagrange Invariant).
- Numerical Aperture, Focal Ratio or F#, Front and Rear Effective F#, Diffraction-limited Resolution.
- Real Ray Trace Procedure, Geometrical Aberrations, Spot Diagrams, Ray Intercept Plots.
- Rms Spot Size, Diffraction-limited Resolution.
- Basic Optical Devices and Instruments
- The Simple Magnifier, Projector, Compound Microscope, The Camera, Telescopes, The Eye (eye model)
- Afocal Systems, Field Lenses and Relay Systems, Radiometer and Detector Optics, Fiber Optics.
- Non imaging systems, Adaptive Optics, and Synthetic Aperture / Lenslet Arrays
- Radiometry and Flux Transfer in Imaging Systems
- Radiometric Terminology and Nomenclature, The Inverse Square Law.
- Radiant Power Transfer, Lambert's Cosine Law, The Brightness Theorem (Optical Throughput or Etendue).
- Radiometry of Images, Cosine-fourth Illumination Fall-off, Limits in Detection of Light.
- Diffraction Effects in Imaging Systems
- Historical Background, Fresnel and Fraunhofer Diffraction
- Aberration-free Diffraction Images, Diffraction-limited Resolution, Effects of Obscurations and Arrays.
- Image Quality (Diffraction Effects, Geo. Aberrations, Scattering Effects, Detector effects).
- What do we Mean by "Diffraction-limited"?
- Introduction to Aberration Theory
- The Wavefront Aberration Function, Relationship of Ray Aberrations to Wavefront Aberrations
- The Effect of Lens Shape and Stop Position, Symmetrical Principle, The Seidel Aberrations
- Structural Aberration Coefficients, Comparison of 3rd-order Aberration Theory with Real Ray Trace Data.
- Image Evaluation/Analysis
- Linear Systems Approach to Image Formation (OTF/MTF, PSF), Other Image Quality Criteria
- Effect of Diffraction and Aberrations on Different Image Quality Criteria,
- Optical Performance Predictions, Detector Effects, Post-detection Image Processing
- Preview of Advanced Topics: Optional
- Optical Manufacturing and Testing
- Computer-optimized Optical Systems Design (demonstration )

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