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| Biography |
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James E. Harvey is an Associate Professor of Optics and Senior Research Staff Member at the Center for Research and Education in Optics and Lasers (CREOL) at the University of Central Florida (UCF). His formal training included an A.B. Degree in Physics from Kansas Wesleyan University and an M.S. Degree in Physics from Wayne State University. Since receiving his Ph.D. in Optical Sciences from the University of Arizona in 1976, Dr. Harvey has been extensively involved in various aspects surface scatter phenomena and X-ray imaging systems. From 1983 to 1989 he was a Senior Scientist at the Perkin-Elmer Corporation where he worked on a variety of NASA sponsored astronomy programs including AXAF and FUSE. He has recently been concerned with deriving optical fabrication tolerances necessary to satisfy specific image quality requirements. Dr. Harvey is credited with three patents and over one hundred publications and presentations in the areas of diffraction theory, surface scatter phenomena, image analysis, X-ray/EUV imaging systems, phased telescope arrays, adaptive optics, wavefront sensing, beam sampling technology and optical properties of materials. He is a member of the OSA, a Fellow of SPIE, and currently serving on the Board of Directors of SPIE.
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| Key Publications and Presentations |
| Refereed Papers | | 2003 |
Harvey, J. E.; Bogunovic, D.; Krywonos, A. "Aberrations of diffracted wave fields: distortion" Applied Optics. 42(7) 1167-1174 |
| 2000 |
Harvey, J. E.; Vernold, C. L.; Krywonos, A.; Thompson, P. L. "Diffracted radiance: a fundamental quantity in nonparaxial scalar diffraction theory: errata" Applied Optics. 39(34) 6374-6375 |
| 2000 |
Thompson, P. L.; Harvey, J. E. "Systems engineering analysis of aplanatic Wolter type I x-ray telescopes" Optical Engineering. 39(6) 1677-1691 |
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| Research |
| Experimental Characterization of Various Optical Phenomena, Materials & Fabrication Processes | | |
| Optical Design and Image Analysis of Advanced Optical Systems | | |
| Simulation and Modeling of Systems Performance for Unconventional Optical Systems | | Image Degradation due to Scattering Effects (Optical Fabrication Errors) |
| Sparse, Optical Array Configurations |
| X-Ray/EUV Imaging Systems (Including Multilayers) |
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