William Silfvast |
| Emeritus Professor of Optics |
| Email |
| Work | silfvast@creol.ucf.edu |
| Phone |
| Office | 407-823-6855 |
| Locations |
| Office | CREOL A115 |
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| Biography |
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William Silfvast received his PhD in Physics form the University of Utah and is currently Emeritus Professor of Optics at UCF. His current interests involve developing efficient short-wavelength sources and their use in new applications, such as soft-X-ray projection lithography and microscopy, and in photoionization spectroscopy. Dr. Silfvast is a Fellow of the American Physical Society, the Optical Society of America, and the IEEE. He has written a book entitled "Laser Fundamentals" published by Cambridge University Press.
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| Awards & Honors |
| 2000 |
Distinguished Researcher of the Year at UCF
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| 2000 |
Emertus Professor of Optics
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| 1999 |
NATO Postdoctoral Fellowship at Oxford University 1999-2003
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| 1983 |
Distinguished Member of the Technical Staff, AT&T Bell Labs
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| 1982 |
Guggenheim Fellowship at Stanford University 1966-67
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| 1980 |
Fellow of IEEE
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| 1980 |
Fellow of Optical Society of America
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| 1980 |
Fellow of the American Physical Society
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| Research |
| EUV Lithography and Microscopy | | |
| X-Ray Science and Technology | | |
| X-ray Theory - X-ray Lasers | | |
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