William Silfvast received his PhD in Physics form the University of Utah and is currently Emeritus Professor of Optics at UCF. His current interests involve developing efficient short-wavelength sources and their use in new applications, such as soft-X-ray projection lithography and microscopy, and in photoionization spectroscopy. Dr. Silfvast is a Fellow of the American Physical Society, the Optical Society of America, and the IEEE. He has written a book entitled "Laser Fundamentals" published by Cambridge University Press.
Awards & Honors
Fellow of IEEE
Fellow of Optical Society of America
Fellow of the American Physical Society
Distinguished Researcher of the Year at UCF
Emertus Professor of Optics
NATO Postdoctoral Fellowship at Oxford University 1999-2003
Distinguished Member of the Technical Staff, AT&T Bell Labs
Guggenheim Fellowship at Stanford University 1966-67
Kazutoshi Takenoshita, Simi George, Chiew-Seng Koay, Jose Cunado, Robert Bernath, Christopher Brown, Moza Al-Rabban, William Silfvast, Martin Richardson
"Characterization of the Tin-doped droplet laser plasma EUV soruces for HVM"
Proceedings of SPIE, Advanced lithographyvolume 6517, 2007
Silfvast, W. T.
"The amazing cadmium atom"
Ieee Journal of Selected Topics in Quantum Electronics. 6(6) 1400-1407
Klosner, M. A.; Silfvast, W. T.
"Xenon-emission-spectra identification in the 5-20-nm spectral region in highly ionized xenon capillary-discharge plasmas"
Journal of the Optical Society of America B-Optical Physics. 17(7) 1279-1290