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Books
1999
Arthur H. Guenther, Mark R. Kozlowski, M.J. Soileau and Gregory J. Exarhos (Eds.)
"Laser-Induced Damage in Optical Materials"
SPIE
1997
Gregory J. Exarhos, Arthur H. Guenther, Mark R. Kozlowski, Keith L. Lewis and M. J. Soileau
"Laser-Induced Damage in Optical Materials"
SPIE
Journal Papers (refereed)
1995
A.A. Said, T. Xia, A. Dogariu, D.J. Hagan, M. J. Soileau, E. Van Stryland, and M. Mohebi
"Measurement of Optical Damage Threshold in Fused Quartz"
Applied Optics, 34, 3374-6
1991
M. Sheik- bahae, A.A. Said, D.J. Hagan, M.J. Soileau, and E.W. Van Stryland
"Nonlinear Refraction and Optical Limiting in “Thick” Media"
Opt. Eng. 30, 1228-1235
1990
Nastaran Mansour, Kamjou Mansour, E.W. Van Stryland, and M.J. Soileau
"Diffusion of Color Centers Generated by Two-Photon-Absorption at 532nm in Cubic Zirconia"
Journal of Applied Physics 67, 1475-1477
1989
Nastaran Mansour, Kamjou Mansour, E.W. Van Stryland, and M.J. Soileau
"Diffusion of Color Centers Generated by Two-Photon-Absorption at 532nm in Cubic Zirconia"
Journal of Applied Physics 67, 1475-1477 (1990).
1989
M.J. Soileau, William E. Williams, Nastaran Mansour, and E.W. Van Stryland
"Laser-Induced-Damage and the Role of Self-Focusing"
Opt. Eng. 28, 1133-1144 (1989).
1988
E.W. Van Stryland, Y.Y. Wu, D.J. Hagan, M.J. Soileau, and Kamjou Mansour
"Optical Limiting with Semiconductors"
JOSA B5, 1980-89
1988
Mehrdad Mohebi, M.J. Soileau, and E.W. Van Stryland
"Resolution of Discrepancies in Measurements of n2 in CS2 at 10 µm"
Opt. Lett. 13, 649
1988
D.J. Hagan, E.W. Van Stryland, M.J. Soileau, and Y.Y. Wu
"Self-Protecting Semiconductor Optical Limiters"
Opt. Lett. 13, 315
1988
Mehrdad Mohebi, M.J. Soileau, and E.W. Van Stryland
"The Effect of Linear Absorption on Self-Focusing"
Opt. Lett. 13, 758
1986
M.J. Soileau, J. Tyminsky, N. Mansour, E. Canto, E.W. Van Stryland, S. Guha, E.J. Sharp, G.L. Wood, and J.L.W. Pohlmann
"Nonlinear Optical Properties of Bi-Phenyl Compounds"
accepted for publication in Mol. Cryst. Liq. Cryst.
1986
Eric W. Van Stryland, Shekhar Guha, H. Vanherzeele, M.A. Woodall, M.J. Soileau, and Brian S. Wherrett
"Verification of the Scaling Rule for Two-Photon Absorption in Semiconductors"
Optica Acta 33, 381-386
1985
Eric W. Van Stryland, M.A. Woodall, H. Vanherzeele, and M.J. Soileau
"Energy Band-Gap Dependence of Two-Photon Absorption"
Opt. Lett. 10, 490
1985
Shekhar Guha, Eric W. Van Stryland, and M. J. Soileau
"Self-Defocusing in CdSe Induced by Charge Carriers Created by Two- Photon Absorption"
Opt. Lett. 10, 285
1985
M. Mohebi, P.F. Aiello, G. Reali, M.J. Soileau, and Eric W. Van Stryland
"Self-Focusing in CS2 at 10.6 µm"
Opt. Lett. 10, 396
1985
M.J. Soileau, Shekhar Guha, William E. Williams, Eric W. Van Stryland, Herman Vanherzeele, Juergen L.W. Pohlmann, E.J. Sharp, and Gary Wood
"Studies of the Nonlinear Switching Properties of Liquid Crystals with Picosecond Pulses"
Mol. Cryst. Liq. Cryst. 127, 321
1985
E. W. Van Stryland, H. Vanherzeele, M.A. Woodall, M.J. Soileau, Arthur L. Smirl, Shekhar Guha, Thomas F. Boggess
"Two-Photon Absorption, Nonlinear Refraction and Optical Limiting in Semiconductors"
Opt. Eng. 24, 613-623 (1985).
1984
M.J. Soileau, William E. Williams, E.W. Van Stryland, Shekhar Guha, H. Vanherzeele, J.L.W. Pohlmann, E.J. Sharp, and G.L. Wood
"Nonlinear Absorption and Nonlinear Refraction Studies in MEBBA"
in Ultrafast Phenomena IV, eds. D. Auston, K.B. Eisenthal, Springer-Verlag, New York, 205 (1984).
1984
William E. Williams, M.J. Soileau, and Eric W. Van Stryland
"Optical Switching and n2 Measurements in CS2"
Opt. Commun. 50, 256
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